Measuring X-ray Flux with Silicon Pin Diodes
Author Information
Author(s): Owen Robin L., Holton James M., Schulze-Briese Clemens, Garman Elspeth F.
Primary Institution: Swiss Light Source, Paul Scherrer Institute
Hypothesis
Can a simple model based on energy deposition in silicon accurately determine the X-ray flux incident on silicon pin diodes?
Conclusion
The study demonstrates that a simple model is sufficient to accurately determine the X-ray flux incident on high-quality silicon pin diodes.
Supporting Evidence
- The model was validated through experiments at multiple beamlines.
- The results showed good agreement between calculated and measured fluxes.
- The study involved a comparison of various diode types and thicknesses.
Takeaway
This study shows how scientists can measure the amount of X-ray light hitting a special sensor called a silicon pin diode, which helps them understand how much energy is absorbed by their samples.
Methodology
The study involved developing a model for photon flux determination and conducting experiments to validate this model using various silicon pin diodes.
Limitations
The accuracy of the model may be affected by uncertainties in diode thickness and charge carrier recombination.
Digital Object Identifier (DOI)
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